By W. Richard Bowen
This is the 1st e-book to compile either the fundamental idea and confirmed procedure engineering perform of AFM. it's awarded in a manner that's available and helpful to training engineers in addition to to people who are bettering their AFM abilities and information, and to researchers who're constructing new items and options utilizing AFM.
The ebook takes a rigorous and functional procedure that guarantees it really is without delay acceptable to procedure engineering difficulties. basics and strategies are concisely defined, whereas particular advantages for method engineering are basically outlined and illustrated. Key content material comprises: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic strength microscopy (AFM) is a vital software for method engineers and scientists because it allows more advantageous strategies and products
- The merely booklet facing the idea and useful purposes of atomic strength microscopy in method engineering
- Provides best-practice advice and event on utilizing AFM for strategy and product improvement
Read or Download Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products PDF
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Additional info for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products
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On close approach between the molecules, attractive (negative sign) forces begin to dominate, with the potential reaching a minimum before repulsive forces from repulsion of opposing electron shells dominate. Keesom or orientational forces arise from the angle averaged interactions between permanent dipoles on opposing molecules. 380 1023 J K1) and T is the absolute temperature. The interaction between the dipoles increases the probability of an orientation between the dipoles, which leads to mutual attraction.